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Semiconductor Inspection Systems
LCD Inspection and Repair Systems
Confocal Scanning Laser Microscopes
Sample Photo
Examples for using Conforcal microscope
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Yield
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Yield
A rate of normally processed dies (chips) expressed as a percentage.
12 million pixels images
Newly Developed Optics
High-Speed Processing
Simple Operation
WIDE Functions
New measurement functions
Production process of semiconductor and LCD TV
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