●[WIDE] is a collective term for 4 options that are[Wave],[Interferometer],[DIC]and[Exceed].
●Wavelength Selectivity
Light selection most suited to sample observation is available from 6 monochromatic lights, 405 nm (purple), 436 nm (blue), 488 nm (cyan), 546 nm (green), 577 nm (yellow) and 630 nm (red) and additionally a white light.
●Mirau / Linnik Interferometer
Integrated confocal interferometer function makes it possible to measure in vertical direction over huge dynamic range from nano-level to milli-level.
●Differential Interference Observation
Differential interference observation function that observes sample surface irregularity of nano-level can be equipped. Moreover, polarization microscope function can be implemented when Nomarski prism is taken off.
●AFM (Atomic Force Microscope)
Integration of AFM with H1200 makes it possible to seamlessly observe from nano-scale to milli-scale.
Scan range: XY 20×20 μｍ、Z 2 μｍ or less
●Confocal and AFM measurement examples (E option)
This is a measurement example of a photonic crystal. The viewing field of the image by H1200 on the upper right is 180μｍ×180μｍ. An arbitrary place of the size of 20μｍ×20μｍ on that area is scanned by AFM to obtain an image on the upper left. By focusing on one of the holes in that picture down to narrowed area of 2μｍ×2μｍ, the resulting image on the bottom is acquired. By this kind of steps, as an example, from acquiring images of mm scale to measuring by the scale of nm become possible.
