- Visualize current density distribution under arbitrary bias voltage. The EL method cannot measure this current density distribution.
- Display I-V characteristics of arbitrary area (the whole cell area, designated area, designated points). Also display P-V characteristics and FF map.
- Visualize conversion efficiency distribution of solar cells with high-speed.
- Measurement by arbitrary wavelength and analysis of shunt, BSFE, individual defect and so on are possible.
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* With regard to MP150 (built-to-order product), please contact our sales department.