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2008

2008.11.21: Integration of the West Japan Sales Office to the Headquarters

2008.11.20: MURA/CD Error High Resolution Visualizing System [WASAVI Series MR300]

2008.11.14: Wafer Inspection / Review System M5640

2008.09.26: Integrated System (OPTELICS SH1200) comprised of Confocal Microscope and Scanning Electron Microscope implements seamless observation from nm through mm range

2008.09.02: Lasertec Korea Corp. has integrated its offices in Seoul and Swon into one office in Bungdan. Operation in the new office has been started since September first.

2008.08.29: Sales Strengthening for Semiconductor Related Tools in the Greater China Market Lasertec Corporation and Hermes-Epitek Corp. enter into Representation Agreement

2008.04.09: Large Size Photomask Substrates / Blanks Inspection System "LB79"

2008.04.09: LCD/TFT•Color Filter Repair System"RAGNAS series"

2008.03.26: Large Mask Inspection System LI712

2008.03.26: A Pellicle Inspection and Pellicle Mounting System for LI712 "71PA/71PP"

2008.03.21: We moved to Shin-yokohama on March 24th.

2008.02.19: Phase Shift / Transmittance Measurement System MPM193EX and ArF Mask Review Station MRS 193EX

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