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New Product
2009
- Dec 1, 2009
- New Product: SiC Wafer Inspection/Review System
[WASAVI Series SICA61]
- Lasertec has commercialized a SiC Wafer Inspection/Review System [WASAVI Series SICA61], and starts to accept orders in December.
* WASAVI: Wafer Surface Analyzing and Visualizing System
- Nov 26, 2009
- New Product: PC Parts Warpage/3D Profile Inspection System [PSK380]
- Lasertec has commercialized a PC Parts Warpage/3D Profile Inspection System [PSK380] that inspects Warpage/3D Profile of Parts for Personal Computer (PC) with high speed, and starts to accept orders in November.
- Nov 12, 2009
- New Product: Haze Removal System PROMAHAZE
- Lasertec has developed a Haze Removal System "PROMAHAZE"* that removes haze (particles
with growth potential) generated on photomask with pellicle frame attached and starts to accept
orders in November.
*PROMAHAZE: Protect Mask From Haze
- Sep 17, 2009
- New Product: Desktop Type PV Cell Efficiency Distribution Measurement System [MAP Series MP15]
- Lasertec has commercialized a new product "Desktop Type PV Cell Efficiency Distribution Measurement System MP15" for visualizing short-circuit current density distribution over the whole area of PV cell in a nondestructive and high-speed manner, which directly contributes to improvement of PV Cell conversion efficiency. Lasertec starts to accept orders for this new product this month.
- Sep 10, 2009
- New Product: Photomask Inspection System
[MATRICS X700 Series]
- Lasertec has commercialized a new product "Photomask Inspection System" [MATRICS X700 Series] that is compatible with photomasks for semiconductor devices of 45 nm design rule and further, and starts to accept orders for this new product in September.
- May 21, 2009
- Visualization of PV Cell Conversion Efficiency Distribution Development and Commercialization of a New Product [PV Cell Conversion Efficiency Distribution Measurement System MP50]
- Development and Commercialization of a new measurement system, MAP Series, MP50 that visualizes current density distribution directly connected to photovoltaic efficiency of both crystalline and thin film PV cells * MAP: Mapping System for Photovoltaic Cell
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