[SEMICON JAPAN 2007] was held for three days from December 5th (Wed.) to 7th (Fri.) and our booth was very well attended all through those three days thanks to your kind support. We deeply thank here all customers who were kind enough to drop by our booth.
Detailed information
| Session |
2007-12-05 18:00 ～ 2007-12-07 18:00 |
| Site |
Makuhari Messe, Chiba |
| Booth No. |
Hall 1 Booth No.1B-301 |
| Booth map |
 |
| Products to be exhibited |
Wafer Inspection Review System,Photomask Inspection System,Pellicle/Photomask Particle Inspection System,Mask Blanks Inspection System,EUVL Mask Substrates / Blanks Inspection System,Phase shift Measurement System,DUV Mask Review Station,3CCD Real Color Confocal Microscope |
