Lasertec has commercialized a new product "Desktop Type PV Cell Efficiency Distribution Measurement System MP15" for visualizing short-circuit current density distribution over the whole area of PV cell in a nondestructive and high-speed manner, which directly contributes to improvement of PV Cell conversion efficiency. Lasertec starts to accept orders for this new product this month.
Description
MP15 is a second launch product that follows the MAP Series MP50 released in May this year. MP15 is a desktop type conversion efficiency distribution measurement system implementing compact dimensions of 510 mm (W), 650 mm (D), 420 mm (H) with the main body weight of mere 40 Kg, while maintaining the basic performance of MP50.
A light source having sunlight spectrum is obtained by combining a Xenon lamp and an AM (Air Mass) 1.5 filter. Furthermore, the measurement time is shortened to half the measurement time of the conventional MP product based on the development of a new stage driving system, resulting in measurement of current density distribution over the whole cell area within one minute.
In general, conversion efficiency of PV cell is measured by solar simulators. However, this type of measurement has a shortcoming that problematic site or region that causes efficiency drop of the cell cannot be readily spotted even when the measured PV cell is verified as a defective cell due to unsatisfactory measurement result in respect to the target conversion efficiency.
The MAP series has implemented visualization of current density distribution under bias voltage over the whole cell area by combining the line illumination and CT (computed tomography) technologies to the technologies, long nurtured and cultivated at Lasertec, for defect inspection system development related to semiconductor and LCD fields. Moreover, MP15 is equipped with a mapping function of open-circuit voltage/FF (FILL FACTOR) necessary for measurement of current-voltage characteristics distribution (distribution of I-V curves). Furthermore, additionally equipped is a measurement function in the depth direction based on selection of the illumination light wavelength, enabling accurate and speedy detection and identification of problematic spots.
Aiming to be the most powerful tool for cell development, quality control and process improvement in the PV cell field, MAP series will be made more powerful and satisfactory with wider variety of product lineup and options for the future.
Technical support to the development of MP15 at Lasertec provided by the Research Center for Photovoltaics, National Institute of Advanced Industrial Science and the Technologies and Research Center for Advanced Science and Technology, University of Tokyo is gratefully acknowledged here.
Key Features
- Visualize current density distribution under arbitrary bias voltage, which cannot be done by the EL method.
- Display of I-V characteristics over an arbitrary area
- Visualize efficiency unevenness and detect shunt, BSFE and individual defects
- Visualize conversion efficiency distribution speedily
- Compact design for desktop use
- Options: High resolution, Wavelength selectivity (400~1200 nm)
Applications
- Nondestructive and noncontact inspection/measurement at various processes of PV cell manufacturing
- Identification of high efficiency areas and low conversion efficiency areas by measurement of short-circuit current/efficiency distribution
- Any type of PV cell under 6 inch dimension such as poly-silicon, thin film and so on can be measured.
Product detail
