ForYear

• 2010
• 2009
• 2008
  • Integration of the West Japan Sales Office to the Headquarters
  • MURA/CD Error High Resolution Visualizing System [WASAVI Series MR300]
  • Amendment of Business Result Forecast and Dividend Forecast
  • Consolidated Financial Review for the First Quarter Ended September 30, 2008
  • Wafer Inspection / Review System M5640
  • Thank you very much for visiting Exhibition SEMICON JAPAN 2008
  • Message from the president is updated.
  • Integrated System (OPTELICS SH1200) comprised of Confocal Microscope and Scanning Electron Microscope implements seamless observation from nm through mm range
  • Lasertec Korea Corp. has integrated its offices in Seoul and Swon into one office in Bungdan. Operation in the new office has been started since September first.
  • Fact Sheet 2008 is newly placed.
  • Sales Strengthening for Semiconductor Related Tools in the Greater China Market Lasertec Corporation and Hermes-Epitek Corp. enter into Representation Agreement
  • Consolidated Financial Review for the Year Ended June 30, 2008
  • Thank you very much for visiting Exhibition Micromachine/MEMS
  • Lasertec Corp. and Carl Zeiss MicroImaging GmbH (Germany) enter OEM Agreement
  • Consolidated Financial Review For the Third Quarter Ended March 31, 2008
  • Thank you very much for visiting FINETECH JAPAN 2008
  • Large Size Photomask Substrates / Blanks Inspection System "LB79"
  • LCD/TFT•Color Filter Repair System"RAGNAS series"
  • Large Mask Inspection System LI712
  • A Pellicle Inspection and Pellicle Mounting System for LI712 [71PA/71PP]
  • We moved to Shin-yokohama on March 24th.
  • Consolidated Finacial Review for Six Months Ended December 31, 2007
  • Phase Shift / Transmittance Measurement System MPM193EX and ArF Mask Review Station MRS 193EX
  • Difference and Adjustment regarding Financial Forecast (Consolidated & Non-consolidated) at Interim Period and End-of-Period for the Year ending June 30 2008, and Dividend Forecast
  • Exhibits at [SEMICON KOREA 2008]
• 2007
• 2006
• 2005
• 2004
• 2003
• 2002
• 2001

ForCategory

• New Product
• Event
• Indication Information
• Business Result Summaries
• etc.

• 
  • 12 million pixels images
  • Newly Developed Optics
  • High-Speed Processing
  • Simple Operation
  • WIDE Functions
  • New measurement functions

• Production process of semiconductor and LCD TV
• EVENT CALENDAR

• Inquiry(General)
• Inquiry(Products)
• Brochure Request
• Consultation about Inspection and Measurement
• Inquiry Window