Transparent wafer inspection

Transparent Object Inspection and Review System
TROIS33

Transparent Object Inspection and Review System
TROIS32

SiC wafer inspection

SiC Wafer Inspection and Review System
SICA88

SiC Wafer Inspection and Review System
SICA6X

GaN wafer inspection

GaN Wafer Inspection and Review System
GALOIS Series

LiB application

Confocal System for In-Situ Observation/Measurement of Electro-Chemical Reactions inside Lithium Ion Batteries
ECCS B320

Coating Thickness Scanning System
TSS20