• Semiconductor Inspection Systems

• LCD Inspection and Repair System‚“ / PV Cell Measurement System‚“

• Confocal Scanning Laser Microscopes

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Examples of using Conforcal microscope

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Feb 1, 2010

Consolidated Financial Results for the Second Quarter Ended December 31, 2009

Feb 1, 2010

Announcement of difference between the forecast and the actual business results

Dec 25, 2009

Amendment of Business Result Forecast

Dec 8, 2009

Thank you very much for visiting Exhibition SEMICON Japan 2009

Dec 1, 2009

New Product: SiC Wafer Inspection/Review System
[WASAVI Series SICA61]

Nov 26, 2009

New Product: PC Parts Warpage/3D Profile Inspection System [PSK380]

Nov 12, 2009

New Product: Haze Removal System PROMAHAZE

Oct 30, 2009

Consolidated Financial Review for the First Quarter Ended September 30, 2009