CD

Description

Critical Dimension (CD) is a width, length, diameter or any other dimension of a small geometrical feature that requires precise control in semiconductor patterns.

Product Search

Product list
Semiconductor-related
FPD-related
Microscopes
Related information
Glossary

A collection of technical words often used with Lasertec products and technologies
Exhibitions

Schedule of events where Lasertec will exibit products
  1. Home
  2. Products
  3. Glossary
  4. CD